首页> 外文OA文献 >Fabrication of Ni-silicide/Si heterostructured nanowire arrays by glancing angle deposition and solid state reaction
【2h】

Fabrication of Ni-silicide/Si heterostructured nanowire arrays by glancing angle deposition and solid state reaction

机译:Fabrication of Ni-silicide/si heterostructured nanowire arrays by glancing angle deposition and solid state reaction

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

This work develops a method for growing Ni-silicide/Si heterostructured nanowire arrays by glancing angle Ni deposition and solid state reaction on ordered Si nanowire arrays. Samples of ordered Si nanowire arrays were fabricated by nanosphere lithography and metal-induced catalytic etching. Glancing angle Ni deposition deposited Ni only on the top of Si nanowires. When the annealing temperature was 500°C, a Ni3Si2 phase was formed at the apex of the nanowires. The phase of silicide at the Ni-silicide/Si interface depended on the diameter of the Si nanowires, such that epitaxial NiSi2 with a {111} facet was formed at the Ni-silicide/Si interface in Si nanowires with large diameter, and NiSi was formed in Si nanowires with small diameter. A mechanism that is based on flux divergence and a nucleation-limited reaction is proposed to explain this phenomenon of size-dependent phase formation.
机译:这项工作开发了一种通过掠过角度Ni沉积和在有序Si纳米线阵列上进行固态反应来生长Ni-硅化物/ Si异质结构纳米线阵列的方法。有序硅纳米线阵列的样品是通过纳米球面光刻和金属诱导的催化蚀刻制成的。掠射角Ni沉积仅将Ni沉积在Si纳米线的顶部。当退火温度为500℃时,在纳米线的顶点形成Ni 3 Si 2相。 Ni-硅化物/ Si界面处的硅化物相取决于Si纳米线的直径,使得在具有大直径的Si纳米线中的Ni-硅化物/ Si界面处形成具有{111}刻面的外延NiSi 2。在小直径的Si纳米线中形成了Si。提出了一种基于通量发散和成核限制反应的机理来解释这种尺寸依赖相形成现象。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号